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Inertial Microsensor System Technical Paper - IMSS |
| Leading in Micro and Wireless Sensor Products |
MICROMECHANICAL ANGULAR RATE SENSORS ARE AMONG THE MOST COMPLEX OF ALL SENSOR SYSTEMS FOR THE MASS MARKET. IT IS COMPOSED, IN THE SMALLEST OF SPACES, OF AN INERT MASS IN A VACUUM THAT EXECUTES COMPLICATED MOTION AS WELL AS SOPHISTICATED ELECTRONIC CIRCUITRY TO DRIVE THE DEVICE AND ANALYSE ITS RESPONSE.
Supported by the latest fabrication technologies and design expertise, SensorDynamics has succeeded in creating an angular rate sensor, ready for series manufacture. It satisfies all the demands made by today's applications, especially those of the automotive industry: a small footprint, mechanical ruggedness, high, long-term stability, unrestricted fail-safety and AEC-Q100 certification. The angular rate sensor is suitable for use in motor vehicles for sure detection of dangerous situations, such as skidding or overturning; and enabling blind driving in navigation systems, outside the range of a GPS signal. The small size of the micromechanical angular rate sensor is what makes some applications possible in the first place, such as stabilizing camcorders or electrically powered unicycles for use inside buildings. |
The way in which an angular rate sensor works is based on what is called the Coriolis force. This is produced when a moving object is forced into a certain path relative to a rotating reference system. For example, if an aircraft flies from the North Pole to a destination on the Equator, it must constantly correct its course to the left to compensate for the Earth's rotation. Apparently, there is a force acting on the aircraft that causes it to veer to the right. On looking more closely, however, one would find that the axis of rotation of the rotating system, the direction of an object moving within it and the Coriolis force acting on it are always exactly at right angles to one another.
This perception leads to the basic structure, shown in Figure 1, of the micromechanical angular rate sensor presented here. |
_img_2.jpg)
Figure 1: Basic structure of the angular rate sensor. FC
symbolizes the Coriolis force, caused by rotation ω and
plate motion v. |
| The sensor consists of a plate-like mass, held by springs and is otherwise able to float freely on its substrate. Attached to the plate are a number of comb-like electrodes that are necessary for the sensor to operate. An electrical alternating voltage is applied to the driving electrodes that set the plate into what is called primary resonance as a result of electrostatic forces (see black arrows in Fig. 1). The amplitude of this resonance is measured and corrected by the monitoring electrode.
Under the influence of an outer rotation, the resonating plate is subjected to a Coriolis force and is deflected out of the plane. This leads to a tipping resonance - the so-called secondary resonance - the amplitude of which is strictly proportional to the outer angular rate. The amplitude of the secondary resonance is measured by further electrodes beneath the plate (not shown in Fig. 1). The anchoring of the plate is constructed so that it can only tip about a single axis. That is why the sensor only responds to rotations whose vector lies in the axis drawn in Fig. 1. |
SENSOR FABRICATION |
| The moving structures in a micromechanical sensor are very small, the moving plate being only a few tenths of a millimetre in diameter and only a hundredth of a millimetre thick. It consequently has to be guarded against external mechanical effects like dust, which requires hermetic encapsulation. Figure 2 shows a cross-section through an encapsulated sensor. Inside the sensor there must be an additional vacuum, because trapped air would cushion the movement of the mass to such an extent that no adequate resonance could be produced. |
| Sensor fabrication is based on silicon technology like that used for the mass production of electronic integrated circuits on silicon wafers. But manufacturing the angular rate sensor also calls for specially developed key technologies that are not needed for normal electronic circuits. These include: a process to generate mobile silicon structures with very precise dimensions; an operation to hermetically encapsulate the sensor elements; and a method to create the vacuum inside the sensor. The proven PSM-X2 process to generate mobile structures was brought up to series manufacturing status by SensorDynamics at its Itzehoe facility. The nucleus of it is a process by which reactive ions generated in a plasma are bombarded vertically onto the wafer surface to etch the required structures out of the silicon. |
_img_5.jpg) Figure 2: Schematic cross-section through a sensor
element. Here you see the electrodes beneath the plate
that are not visible in Fig. 1. |
_img_6.jpg)
Figure 3: Etching apparatus to produce micromechanical
structures. |
Sensor fabrication is based on silicon technology like that used for the mass production of electronic integrated circuits on silicon wafers. But manufacturing the angular rate sensor also calls for specially developed key technologies that are not needed for normal electronic circuits. These include: a process to generate mobile silicon structures with very precise dimensions; an operation to hermetically encapsulate the sensor elements; and a method to create the vacuum inside the sensor. The proven PSM-X2 process to generate mobile structures was brought up to series manufacturing status by SensorDynamics at its Itzehoe facility. The nucleus of it is a process by which reactive ions generated in a plasma are bombarded vertically onto the wafer surface to etch the required structures out of the silicon.
Figure 3 shows the etching apparatus used for this purpose. It produces extremely sharp-edged structures with a depth of 11 µm and width of only 1 µm. |
Figure 4 shows a section of the sensor with its exact micromechanical structures of polycrystalline silicon. The real-life section is approx. 0.12 mm long.
For encapsulation a second top wafer is deposited on the sensor wafer. This is shaped in a way, that, together with the bottom sensor wafer, precisely defined cavities are formed. The two wafers are welded together at high temperature on the edges of these cavities. The material used is a thin gold layer, the gold alloying with the silicon at 400°C to form a eutectic, resulting in a hermetically tight join.
The vacuum inside the sensor is created by means of a getter, heated to absorb all the gas in the cavity. This getter is a thin film made of a zirconium alloy, which subsequently remains in the sensor (see Fig. 2). The vacuum produced in this way will remain constant for decades. |
_img_7.jpg)
Figure 4: The sensor structure seen under a scanning electron microscope. |
SENSOR ELECTRONICS |
| The angular rate sensor operates with an application-specific IC that drives the sensor and is able to detect the very small changes in capacitance produced by motion of the plate. Fabrication of this ASIC requires a semiconductor process for very small input leakage currents and very good noise properties. The automotive certified 0.35 µm BCD6s process from STMicroelectronics that is used here satisfies these requirements as well as offering high-volt capability to more than 50 V plus temperature survivability at over 125°C. This high-volt strength of the circuit means that the sensor element can be driven by higher voltages. Correspondingly high electrostatic force can be generated to drive the sensor element, which can be designed to be more rigid mechanically as a result. This is important for high impact strength of the sensor elements. |
| A simplified schematic will illustrate major fail-safety aspects of the sensor system. The monitoring electrodes serve to control the resonance amplitude of the sensor plate (see also Fig. 1). In Figure 5 it is possible to see how the signal from the monitoring electrodes is first amplified in input stage 1 and then digitized by analogue/digital converter ADC1. This signal has the frequency fr of the mechanical resonance of the mass. A digital PLL generates a signal of the same frequency and normalized amplitude (fn). The signal fr is now compared by the amplitude control to the normalized signal fn and thus kept at a constant amplitude. |
_img_10.jpg)
Figure 5: Simplified schematic of the ASIC. Input stage 2 and the test signal generator are connected to electrodes beneath the sensor element. |
A circuit monitors all analogue and digital blocks and issues an alarm as soon as a parameter is no longer within precisely defined limits. If the resonance of the plate ceases for example, the PLL goes into limiting, which is easily detected by the monitoring circuit.
The actual measurement signal path is formed by a substrate electrode, input stage 2, ADC2 and mixer M1. As already explained, the substrate electrode detects secondary plate deflection as a function of angular rate. The measurement signal is also modulated with fr and so it can be demodulated by mixing with fn.
Secondary plate resonance is monitored by a test signal that periodically deflects the plate electrostatically with a frequency close to fr. For this purpose there are additional substrate electrodes that are isolated from those of the signal path. The signal after ADC2 consequently contains the test signal in addition to the measurement signal. Mixing in M2 produces a DC signal from the test signal that is easily and continuously monitored. A filter on the output removes the test signal from the measurement signal. More than 20 parameters are monitored in the ASIC to ensure fail-safety throughout. All related, necessary design measures are to IEC 61508 recommendations. |
SENSOR MODULE |
| Fail-safety is not restricted to the sensor chip and the ASIC; the latter also supports it at module level. Figure 6 illustrates the concept of fail-safety at module level together with the microcontroller. As a first measure the microcontroller not only communicates on the SPI interface with the ASIC but also by a hardwired bit (HW_BIT). This increases the safety level by redundancy. As a second measure a handshake protocol for the SPI is implemented. Thus, if the microcontroller itself should fail, the ASIC is able to determine this on SPI and turn off the CAN transceiver on the µC_fail line, if necessary. This prevents the faulty module from disturbing the CAN bus. |
_img_11.jpg)
Figure 6: Fail-safety at module level, where SIL 3 is possible. |
SYSTEM DEVELOPMENT |
Independent development of the individual components such as the sensor, ASIC and package is no longer adequate to guarantee the requirements made by the sensor system, e.g. extended operating temperature range, shock and vibration resistance as well as fail-safety throughout. Consequently, in an early project phase, SensorDynamics set up parallel development of a performance model of the overall system using the results of the FEM simulation of the sensor element, for example, and those of the circuit simulation.
Another important aspect in the manufacturing of a sensor system for the automotive market is thorough traceability of all fabrication steps and their continuous improvement. Among other things, this is guaranteed by sole use of TS 16949-certified manufacturing equipment and the installation of statistical process control. SensorDynamics also develops special methods to test quality in mass production. Examples are a leakage test at wafer level to inspect the tightness of the encapsulated sensor elements and a new component handler to calibrate angular rate sensors. |
_img_14.jpg)
Figure 7: SensorDynamics clean room in Lebring near Graz, used to develop and trial test concepts. |
SENSOR SPECIFICATIONS |
| Table 1 lists a number of specifications of the SD751 angular rate sensor. In addition to the measurement range of 100°/s, the sensor provides a second range of 300°/s but lower resolution. The two signals with high and low resolution are brought out on the SPI interface simultaneously. In this way it is possible to detect both slow rotation with high resolution and fast rotation without switching the measurement range.
SD755 is a variant containing, in addition to the angular rate sensor, an acceleration sensor with two simultaneous measurement ranges of 2 g and 5 g. Further measurement ranges up to 50 g can be implemented without changing the design. The forerunner version of the SD751 is already AEC-Q100 qualified, and the qualification results of the SD751 and SD755 will be presented in the course of the year. Figure 8 shows the sensitive axes for the angular rate and the acceleration sensor: a indicating the acceleration and ωthe rotation. The sensor is shown packaged in an OC24, fabricated by ASE in Korea. |
| Interface |
SPI |
| Impact resistance in operation |
±1500 g |
| Recovery time after 100 g impact |
5 ms |
| Ambient temperature range |
125 |
| Package |
OC24 |
Table 1: Selected specifications of the SD751 angular rate sensor; all listed errors apply over the entire ambient temperature range. |
| Measurement range |
±100°/s |
| Resolution |
0.0039°/s |
| Signal/noise (BW = 25 Hz) |
0.1°/s |
| Offset error incl. aging |
±2°/s |
| Cross-sensitivity to rotation about other axes |
2% |
| Cross-sensitivity to acceleration |
0.1°/s/g |
| Linearity error (best fit) |
±0.2% FS |
| Sensitivity error |
±2% |
|
OUTLOOK |
| Development efforts at SensorDynamics are heading in the direction of integrating multidimensional angular rate and acceleration sensors in one package and further improving shock survivability. The aim is a general-purpose sensor capable of detecting both angular rate and acceleration on all three spatial axes.
Not all applications require all six signals, so other combinations are intended to optimize cost, e.g. a unidimensional angular rate sensor with a three-dimensional acceleration sensor. All variants will be of fail-safe design, however, and AEC-Q100 qualified.
As a result of cooperation with Kionix, which contributes excellent expertise in three-dimensional acceleration sensors, virtually all components are already in place for a six-dimensional sensor. |
_img_15.jpg) |
COMPLETE MICROSENSOR SOLUTION - MODELLED, DESIGNED, FABRICATED, PACKAGED AND TESTED - READY TO GO! QUESTIONS - CALL 248.615.4441 |
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